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Run-in-test
  run-in-test riese electronic  

At the rush in test your assemblies are tested under burden and changing temperature conditions. By this test faults which appear due to faulty components only under burden are excluded. To this end has reams of two temperature cupboards with a temperature area of -45 ° degrees Celsius to approx. +300° degrees Celsius in which C normally is the fluctuation breadth of most tests at -20 ° degrees Celsius to +80°.

 
 

Test in the temperature cupboard

         
             
   
     
             
   
 
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